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EDDIDAT is made to analyze diffraction data from various energy-dispersive X-ray sources. Thus you're able to include new resources and implement the device-specific properties into EDDIDAT. This program is freely open to academic users.AlN cuts from volume crystals grown under reduced thermomechanical tension circumstances through the real vapor transportation (PVT) method were reviewed by X-ray techniques to learn the impact of this development mode from the crystal quality. Defect types and densities had been examined along axial [0001] as well as lateral development directions. X-ray diffraction (0110) rocking-curve mappings of representative wafer cuts expose a low mean FWHM of 13.4 arcsec, indicating the usually large crystal quality. The sum total dislocation density of 2 × 103 cm-2 as determined by X-ray topography is reduced and dislocations tend to be mostly threading side dislocations of b = 1/3〈1120〉 type. The lack of basal plane dislocations in homogeneous crystal areas void of macroscopic flaws could be linked to the low-stress growth problems. Under the investigated growth conditions this large crystal quality could be preserved both along the axial [0001] course and within lateral development directions. Exceptions for this are a handful of locally restricted, misoriented grains and defect clusters, most of that are straight passed down from the seed or tend to be created due to the employed seed fixation technique on the external periphery of this crystals. Seed-shaping experiments suggest no evident kinetic limits for an advanced lateral development price and also the resulting crystal quality, particularly with regard to the rise mode on a-face facets.A brand-new approach to parafocusing X-ray diffraction implemented with an annular event beam is shown the very first time. The strategy exploits an elliptical specimen path on an appartment test to produce fairly high intensity maxima that can be measured with a spot detector. It really is shown that the flat-specimen approximation tolerated by main-stream Bragg-Brentano geometries isn't needed. A theoretical framework, simulations and experimental outcomes for both angular- and energy-dispersive measurement settings tend to be presented as well as the scattering signatures compared to information acquired with a regular pencil-beam arrangement.Ptychographic X-ray imaging during the highest spatial resolution requires an optimal experimental environment, providing a high coherent flux, excellent mechanical security and a minimal background within the calculated data. This involves, for example, a reliable performance of most optical components across the whole ray road, temperature security, a robust sample and optics monitoring system, and a scatter-free environment. This contribution summarizes the attempts along these lines to change the nanoprobe station on beamline P06 (PETRA III) into the ptychographic nano-analytical microscope (PtyNAMi).The pressing need for knowledge of the detail by detail wavefront properties of ultra-bright and ultra-short pulses produced by free-electron lasers has actually spurred the development of a few complementary characterization approaches. Here a technique predicated on ptychography is presented that will retrieve high-resolution complex-valued wavefunctions of individual pulses without powerful limitations on the illumination or sample item used. The method is shown within experimental circumstances rgdyk inhibitor suited to diffraction experiments and exploiting Kirkpatrick-Baez focusing optics. This lensless technique, applicable to a lot of other short-pulse instruments, is capable of diffraction-limited resolution.Spectroscopic ptychography is a powerful technique to determine the chemical composition of a sample with high spatial resolution. In spectro-ptychography, an example is rastered through a focused X-ray beam with differing photon energy to ensure that a number of phaseless diffraction information tend to be recorded. Each chemical element into the material under research has actually a characteristic consumption and phase contrast as a function of photon power. Using a dictionary created because of the set of comparison functions of each and every energy for every chemical element, you can obtain the substance structure regarding the material from high-resolution multi-spectral pictures. This report presents SPA (spectroscopic ptychography with alternating course method of multipliers), a novel algorithm to iteratively solve the spectroscopic blind ptychography issue. Very first, a nonlinear spectro-ptychography design centered on Poisson optimum chance is made, after which the suggested technique is built regarding the basis of fast iterative splitting providers. SPA may be used to access spectral contrast when it comes to either a known or an incomplete (partially known) dictionary of guide spectra. By coupling the redundancy across different spectral measurements, the proposed algorithm can achieve greater repair high quality in comparison to standard state-of-the-art two-step practices. It's demonstrated exactly how salon can recuperate accurate chemical maps from Poisson-noised measurements, and its enhanced robustness when reconstructing reduced-redundancy ptychography information making use of big scanning step sizes is shown.The ever-increasing brightness of synchrotron radiation sources demands improved X-ray optics to work well with their particular capability for imaging and probing biological cells, nano-devices and functional matter in the nanometre scale with chemical sensitiveness. Hard X-rays are perfect for high-resolution imaging and spectroscopic applications because of their particular brief wavelength, large acute energy and chemical sensitivity. The acute energy that makes X-rays useful for imaging also makes concentrating all of them technologically challenging.
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